HL5216 Ruggedized Signal Path Analyzer™
The HL5216 Signal Path Analyzer™ measures TDR, TDT, return loss, and insertion loss in high-speed interconnects, cables, and PCB traces.
With a fast 200 ps rise time, ESD robustness, and highly-customizable software controls, these instruments provide a cost-effective alternative to traditional benchtop and factory-floor test systems.
The included XTDR™ software for Windows displays full waveforms and numerical measurements in a highly-customizable user interface. The instrument is powered and controlled using a single USB cable.